The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Mar. 11, 2011
Applicants:

Christopher J. Leavitt, Gloucester, MA (US);

Ludovic Godet, Boston, MA (US);

Timothy J. Miller, Ipswich, MA (US);

Inventors:

Christopher J. Leavitt, Gloucester, MA (US);

Ludovic Godet, Boston, MA (US);

Timothy J. Miller, Ipswich, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); H01J 37/302 (2006.01); H01J 37/317 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3172 (2013.01); H01J 37/3023 (2013.01); H01J 37/32376 (2013.01); Y02E 10/52 (2013.01); H01J 37/32623 (2013.01); H01J 37/32137 (2013.01); H01J 37/32412 (2013.01); H01J 37/32009 (2013.01); H01J 2237/31711 (2013.01);
Abstract

A method of implanting a workpiece in an ion implantation system. The method may include providing an extraction plate adjacent to a plasma chamber containing a plasma, such that the extraction plate extracts ions from the plasma through at least one aperture that provides an ion beam having ions distributed over a range of an angles of incidence on the workpiece. The method may include scanning the workpiece with respect to the extraction plate and varying a power level of the plasma during the scanning from a first power level to a second power level, wherein at a surface of the workpiece, a first beam width at a first power level is greater than a second beam width at a second power level.


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