The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Nov. 18, 2010
Applicants:

Kyunghoon Lee, Kyunggi-Do, KR;

Soo Moon Park, Kyunggi-Do, KR;

Seungwon Kim, Kyunggi-Do, KR;

Inventors:

KyungHoon Lee, Kyunggi-Do, KR;

Soo Moon Park, Kyunggi-Do, KR;

SeungWon Kim, Kyunggi-Do, KR;

Assignee:

STATS ChipPAC, Ltd., Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/498 (2006.01); H01L 21/56 (2006.01); H01L 23/31 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3121 (2013.01); H01L 2224/97 (2013.01); H01L 24/16 (2013.01); H01L 21/563 (2013.01); H01L 2224/8114 (2013.01); H01L 23/49816 (2013.01); H01L 2924/13091 (2013.01); H01L 24/97 (2013.01); H01L 21/561 (2013.01); H01L 21/565 (2013.01); H01L 2224/10165 (2013.01); H01L 23/49827 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/01322 (2013.01); H01L 21/568 (2013.01); H01L 24/81 (2013.01); H01L 23/3128 (2013.01); H01L 24/13 (2013.01);
Abstract

A semiconductor device has an interposer frame having a die attach area. A uniform height insulating layer is formed over the interposer frame at corners of the die attach area. The insulating layer can be formed as rectangular or circular pillars at the corners of the die attach area. The insulating layer can also be formed in a central region of the die attach area. A semiconductor die has a plurality of bumps formed over an active surface of the semiconductor die. The bumps can have a non-fusible portion and fusible portion. The semiconductor die is mounted over the insulating layer which provides a uniform standoff distance between the semiconductor die and interposer frame. The bumps of the semiconductor die are bonded to the interposer frame. An encapsulant is deposited over the semiconductor die and interposer frame and between the semiconductor die and interposer frame.


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