The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Apr. 28, 2011
Applicants:

S. Jay Chey, Ossining, NY (US);

Timothy C. Krywanczyk, Essex Junction, VT (US);

Mohammed S. Shaikh, Essex Junction, VT (US);

Matthew T. Tiersch, Essex Junction, VT (US);

Cornelia Kang-i Tsang, Mohegan Lake, NY (US);

Inventors:

S. Jay Chey, Ossining, NY (US);

Timothy C. Krywanczyk, Essex Junction, VT (US);

Mohammed S. Shaikh, Essex Junction, VT (US);

Matthew T. Tiersch, Essex Junction, VT (US);

Cornelia Kang-I Tsang, Mohegan Lake, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01R 43/00 (2006.01); G01R 3/00 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 3/00 (2013.01); G01R 1/07378 (2013.01);
Abstract

A silicon chicklet pedestal for use in a wafer-level test probe of a wafer is provided and includes a main body, first and second opposing faces, and an array of vias formed through the main body to extend between the first and second faces, through which pairs of leads, respectively associated with each via at the first and second faces, are electrically connectable to one another.


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