The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Aug. 15, 2013
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Kenji Abe, Tokyo, JP;

Masaki Kurokawa, Tokyo, JP;

Akiyoshi Tsuda, Tokyo, JP;

Hideki Nasuno, Tokyo, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 37/244 (2006.01); H01J 9/00 (2006.01); G01N 23/00 (2006.01); G01N 7/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/244 (2013.01); H01J 9/00 (2013.01);
Abstract

There is provided an electron beam detector including an electron beam scatterer which is disposed at a predetermined distance below a shield including a plurality of openings formed therein, and a beam detection element disposed at a predetermined distance below the scatterer and configured to convert an electron beam into an electric signal. In the electron beam detector, the scatterer is disposed at an equal distance from any of the openings in the shield, and the beam detection element is disposed at an equal distance from any of the openings in the shield. Thus, the electron beam detector can suppress a variation in detection sensitivity depending on the position of the opening.


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