The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Jul. 20, 2009
Janusz Rajski, West Linn, OR (US);
Nilanjan Mukherjee, Wilsonville, OR (US);
Mark a Kassab, Wilsonville, OR (US);
Thomas H. Rinderknecht, Tualatin, OR (US);
Mohamed Dessouky, El-Rehab, EG;
Janusz Rajski, West Linn, OR (US);
Nilanjan Mukherjee, Wilsonville, OR (US);
Mark A Kassab, Wilsonville, OR (US);
Thomas H. Rinderknecht, Tualatin, OR (US);
Mohamed Dessouky, El-Rehab, EG;
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Methods and devices for using high-speed serial links for scan testing are disclosed. The methods can work with any scheme of scan data compression or with uncompressed scan testing. The protocol and hardware to support high speed data transfer reside on both the tester and the device under test. Control data may be transferred along with scan data or be partially generated on chip. Clock signals for testing may be generated on chip as well. In various implementations, the SerDes (Serializer/Deserializer) may be shared with other applications. The Aurora Protocol may be used to transport industry standard protocols. To compensate for effects of asynchronous operation of a conventional high-speed serial link, buffers may be used. The high-speed serial interface may use a data conversion block to drive test cores.