The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8722481 B1

PDF
Full Text
Expired
Date of Patent:
May. 13, 2014

Filed:

Jun. 04, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Stephan-Detlef Kronholz, Dresden, DE;

Peter Javorka, Radeburg, DE;

Maciej Wiatr, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Gand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/8234 (2006.01);
U.S. Cl.
CPC ...
Abstract

When forming high-k metal gate electrode structures in a semiconductor device on the basis of a basic transistor design, undue exposure of sensitive materials at end portions of the gate electrode structures of N-channel transistors may be avoided, for instance, prior to and upon incorporating a strain-inducing semiconductor material into the active region of P-channel transistors, thereby contributing to superior production yield for predefined transistor characteristics and performance.


Find Patent Forward Citations

Kronholz, Stephan-Detlef. (2014). Superior integrity of high-k metal gate stacks by preserving a resist material above end caps of gate electrode structures (U.S. Patent No. 8722481). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8722481

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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