The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Jul. 27, 2011
Applicants:

Paul F. Bodenweber, Kingston, NY (US);

Virendra R. Jadhav, Farum, NY (US);

Kamal K. Sikka, Poughkeepsie, NY (US);

Jiantao Zheng, Beacon, NY (US);

Jeffrey A. Zitz, Poughkeepsie, NY (US);

Inventors:

Paul F. Bodenweber, Kingston, NY (US);

Virendra R. Jadhav, Farum, NY (US);

Kamal K. Sikka, Poughkeepsie, NY (US);

Jiantao Zheng, Beacon, NY (US);

Jeffrey A. Zitz, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/00 (2006.01); G01R 27/26 (2006.01); G01N 27/62 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for determining a thickness change of thermal interface material (TIM) disposed between first and second elements is provided. The apparatus includes a first part movable with the first element in a movement direction along which the TIM thickness is to be determined, a second part movable with the second element in the movement direction and a sensor to measure a distance between the first and second parts in the movement direction, the measured distance being related to the TIM thickness change.


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