The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

Mar. 22, 2012
Applicants:

Brian T. Cantrell, Port Deposit, MD (US);

Kathleen Mchugh, Newark, DE (US);

James T. Murnane, Norristown, PA (US);

George H. Mcclain, Middletown, DE (US);

Durron A. Hutt, Wilmington, DE (US);

Robert A. Brady, Coatesville, PA (US);

Christopher A. Young, Newark, DE (US);

Jeffrey Borcherdt Miller, West Chester, PA (US);

Inventors:

Brian T. Cantrell, Port Deposit, MD (US);

Kathleen McHugh, Newark, DE (US);

James T. Murnane, Norristown, PA (US);

George H. McClain, Middletown, DE (US);

Durron A. Hutt, Wilmington, DE (US);

Robert A. Brady, Coatesville, PA (US);

Christopher A. Young, Newark, DE (US);

Jeffrey Borcherdt Miller, West Chester, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24D 3/00 (2006.01); B24D 11/00 (2006.01); B24D 18/00 (2006.01); C09K 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing polishing layers for use in chemical mechanical polishing pads is provided, wherein a plurality of polishing layers are derived from a cake, wherein the formation of density defects in the cake and the surface roughness of the polishing layers formed are minimized.


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