The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Jun. 18, 2010
Applicants:

Kevin Moeggenborg, Naperville, IL (US);

William Ward, Glen Ellyn, IL (US);

Ming-shih Tsai, Jhudong Township, TW;

Francesco DE Rege Thesauro, Naperville, IL (US);

Inventors:

Kevin Moeggenborg, Naperville, IL (US);

William Ward, Glen Ellyn, IL (US);

Ming-Shih Tsai, Jhudong Township, TW;

Francesco De Rege Thesauro, Naperville, IL (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); B44C 1/22 (2006.01); H01L 21/3105 (2006.01); H01L 21/321 (2006.01); C09K 3/14 (2006.01); C09G 1/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31053 (2013.01); H01L 21/3212 (2013.01); C09K 3/1463 (2013.01); C09G 1/02 (2013.01);
Abstract

The present invention provides a chemical-mechanical polishing (CMP) composition suitable for polishing a silicon nitride-containing substrate while suppressing polysilicon removal from the substrate. The composition comprises abrasive particles suspended in an acidic aqueous carrier containing a surfactant comprising an alkyne-diol, an alkyne diol ethoxylate, or a combination thereof. Methods of polishing a semiconductor substrate therewith are also disclosed.


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