The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Jun. 22, 2012
Applicants:

Luan Tran, Meridian, ID (US);

William T. Rericha, Boise, ID (US);

John Lee, Boise, ID (US);

Ramakanth Alapati, Boise, ID (US);

Sheron Honarkhah, Boise, ID (US);

Shuang Meng, Boise, ID (US);

Puneet Sharma, Ames, IA (US);

Jingyi Bai, San Jose, CA (US);

Zhiping Yin, Boise, ID (US);

Paul Morgan, Kuna, ID (US);

Mirzafer K. Abatchev, Boise, ID (US);

Gurtej S. Sandhu, Boise, ID (US);

D. Mark Durcan, Boise, ID (US);

Inventors:

Luan Tran, Meridian, ID (US);

William T. Rericha, Boise, ID (US);

John Lee, Boise, ID (US);

Ramakanth Alapati, Boise, ID (US);

Sheron Honarkhah, Boise, ID (US);

Shuang Meng, Boise, ID (US);

Puneet Sharma, Ames, IA (US);

Jingyi Bai, San Jose, CA (US);

Zhiping Yin, Boise, ID (US);

Paul Morgan, Kuna, ID (US);

Mirzafer K. Abatchev, Boise, ID (US);

Gurtej S. Sandhu, Boise, ID (US);

D. Mark Durcan, Boise, ID (US);

Assignee:

Round Rock Research LLC, Jersey City, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/118 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit having differently-sized features wherein the smaller features have a pitch multiplied relationship with the larger features, which are of such size as to be formed by conventional lithography.


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