The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Feb. 27, 2013
Taiwan Semiconductor Manufacturing Co. Ltd., Hsin-Chu, TW;
Feng Wei Kuo, Zhudong Township, TW;
Kuang-Kai Yen, Kaohsiung, TW;
Huan-Neng Chen, Taichung, TW;
Hsien-Yuan Liao, Huatan Township, TW;
Lee Tsung Hsiung, New Taipei, TW;
Chewn-Pu Jou, Hsinchu, TW;
Robert Bogdan Staszewski, PA Delft, NL;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;
Abstract
The present disclosure relates to an all digital phase locked loop (APDLL) that can account for variations in PVT conditions, and a related method of formation. In some embodiments, the ADPLL has a controllable time-to-digital converter (TDC) having a plurality of variable delay elements. The controllable TDC is determines a phase difference between a frequency reference signal and a local oscillator clock signal and to generate a phase error therefrom. A digitally controlled oscillator (DCO) varies a phase of the local oscillator clock signal based upon the phase error. A calibration unit determines an effect of variations in PVT (process, voltage, and temperature) conditions based upon the phase error and to generate a TDC tuning word that adjusts a delay introduced by one or more of the plurality of variable delay elements to account for the variations in PVT conditions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile