The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Apr. 22, 2010
Janusz Rajski, West Linn, OR (US);
Elham K. Moghaddam, Beaverton, OR (US);
Nilanjan Mukherjee, Wilsonville, OR (US);
Mark a Kassab, Wilsonville, OR (US);
Xijiang Lin, West Linn, OR (US);
Janusz Rajski, West Linn, OR (US);
Elham K. Moghaddam, Beaverton, OR (US);
Nilanjan Mukherjee, Wilsonville, OR (US);
Mark A Kassab, Wilsonville, OR (US);
Xijiang Lin, West Linn, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Test patterns for at-speed scan tests are generated by filling unspecified bits of test cubes with functional background data. Functional background data are scan cell values observed when switching activity of the circuit under test is near a steady state. Hardware implementations in EDT (embedded deterministic test) environment are also disclosed.