The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8470659 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 25, 2013

Filed:

Aug. 27, 2012
Applicants:

Liang-gi Yao, Shinchu, TW;

Chun-hu Cheng, Hsinchu, TW;

Chen-yi Lee, Keelung, TW;

Jeff J. Xu, Jhubei, TW;

Clement Hsingjen Wann, Carmel, NY (US);

Inventors:

Liang-Gi Yao, Shinchu, TW;

Chun-Hu Cheng, Hsinchu, TW;

Chen-Yi Lee, Keelung, TW;

Jeff J. Xu, Jhubei, TW;

Clement Hsingjen Wann, Carmel, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8249 (2006.01);
U.S. Cl.
CPC ...
Abstract

This description relates to a method including forming an interfacial layer over a semiconductor substrate. The method further includes etching back the interfacial layer. The method further includes performing an ultraviolet (UV) curing process on the interfacial layer. The UV curing process includes supplying a gas flow rate ranging from 10 standard cubic centimeters per minute (sccm) to 5 standard liters per minute (slm), wherein the gas comprises inert gas, and heating the interfacial layer at a temperature less than or equal to 700° C. The method further includes depositing a high-k dielectric material over the interfacial layer.


Find Patent Forward Citations

Quick Actions:

Yao, Liang-Gi. (2013). Method for reducing interfacial layer thickness for high-k and metal gate stack (U.S. Patent No. 8470659). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8470659

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…