The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8461009 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 11, 2013

Filed:

Feb. 28, 2006
Applicants:

Atul C. Ajmera, Wappingers Falls, NY (US);

Christopher V. Baiocco, Newburgh, NY (US);

Xiangdong Chen, Poughquag, NY (US);

Wenzhi Gao, Beacon, NY (US);

Young Way Teh, Singapore, MY;

Inventors:

Atul C. Ajmera, Wappingers Falls, NY (US);

Christopher V. Baiocco, Newburgh, NY (US);

Xiangdong Chen, Poughquag, NY (US);

Wenzhi Gao, Beacon, NY (US);

Young Way Teh, Singapore, MY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

Process for enhancing strain in a channel with a stress liner, spacer, process for forming integrated circuit and integrated circuit. A first spacer composed of an first oxide and first nitride layer is applied to a gate electrode on a substrate, and a second spacer composed of a second oxide and second nitride layer is applied. Deep implanting of source and drain in the substrate occurs, and removal of the second nitride, second oxide, and first nitride layers.


Find Patent Forward Citations

Ajmera, Atul. (2013). Spacer and process to enhance the strain in the channel with stress liner (U.S. Patent No. 8461009). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8461009

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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