The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8460980 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 11, 2013

Filed:

Feb. 22, 2010
Applicants:

Stephan Kronholz, Dresden, DE;

Maciej Wiatr, Dresden, DE;

Matthias Kessler, Dresden, DE;

Inventors:

Stephan Kronholz, Dresden, DE;

Maciej Wiatr, Dresden, DE;

Matthias Kessler, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 27/762 (2006.01);
U.S. Cl.
CPC ...
Abstract

A strain-inducing semiconductor alloy may be formed on the basis of cavities that may extend deeply below the gate electrode structure, which may be accomplished by using a sequence of two etch processes. In a first etch process, the cavity may be formed on the basis of a well-defined lateral offset to ensure integrity of the gate electrode structure and, in a subsequent etch process, the cavity may be increased in a lateral direction while nevertheless reliably preserving a portion of the channel region. Consequently, the strain-inducing efficiency may be increased by appropriately positioning the strain-inducing material immediately below the channel region without compromising integrity of the gate electrode structure.


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