The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Feb. 24, 2009
Applicants:

Moh Lung Ling, Singapore, SG;

Gek Soon Chua, Singapore, SG;

Qunying Lin, Singapore, SG;

Cho Jui Tay, Singapore, SG;

Chenggen Quan, Singapore, SG;

Inventors:

Moh Lung Ling, Singapore, SG;

Gek Soon Chua, Singapore, SG;

Qunying Lin, Singapore, SG;

Cho Jui Tay, Singapore, SG;

Chenggen Quan, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/30 (2006.01); G03B 27/72 (2006.01);
U.S. Cl.
CPC ...
G03F 7/30 (2013.01); G03B 27/72 (2013.01);
Abstract

A method for fabricating a semiconductor device that includes: providing a substrate prepared with a photoresist layer; providing a photomask comprising a first and a second pattern having a respective first and second pitch range; providing a composite aperture comprising a first and a second off-axis illumination aperture pattern, the first off-axis aperture pattern having a configuration that improves the process window of the first pitch range and the second off-axis aperture pattern having a configuration that improves the process window for a second pitch range; exposing the photoresist layer on the substrate with radiation from an exposure source through the composite aperture and the photomask; and developing the photoresist layer to pattern the photoresist layer.


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