The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Feb. 25, 2009
Applicants:

Megumi Ishiduki, Yokohama, JP;

Hideaki Aochi, Kawasaki, JP;

Ryota Katsumata, Yokohama, JP;

Hiroyasu Tanaka, Tokyo, JP;

Masaru Kidoh, Komae, JP;

Masaru Kito, Yokohama, JP;

Yoshiaki Fukuzumi, Yokohama, JP;

Yosuke Komori, Yokohama, JP;

Yasuyuki Matsuoka, Yokohama, JP;

Inventors:

Megumi Ishiduki, Yokohama, JP;

Hideaki Aochi, Kawasaki, JP;

Ryota Katsumata, Yokohama, JP;

Hiroyasu Tanaka, Tokyo, JP;

Masaru Kidoh, Komae, JP;

Masaru Kito, Yokohama, JP;

Yoshiaki Fukuzumi, Yokohama, JP;

Yosuke Komori, Yokohama, JP;

Yasuyuki Matsuoka, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/792 (2006.01); H01L 21/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-volatile semiconductor storage device has a plurality of memory strings with a plurality of electrically rewritable memory cells connected in series. Each of the memory strings includes: a columnar semiconductor layer extending in a direction perpendicular to a substrate; a plurality of conductive layers formed at a sidewall of the columnar semiconductor layer via memory layers; and interlayer insulation layers formed above of below the conductive layers. A sidewall of the conductive layers facing the columnar semiconductor layer is formed to be inclined such that the distance thereof from a central axis of the columnar semiconductor layer becomes larger at lower position thereof than at upper position thereof. While, a sidewall of the interlayer insulation layers facing the columnar semiconductor layer is formed to be inclined such that the distance thereof from a central axis of the columnar semiconductor layer becomes smaller at lower position thereof than at upper position thereof.


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