The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Mar. 26, 2010
Ramachandran Krishnaswamy, Santa Clara, CA (US);
Harsanjeet Singh, Santa Clara, CA (US);
Ankan Pramanick, Santa Clara, CA (US);
Mark Elston, Santa Clara, CA (US);
Leon Chen, Santa Clara, CA (US);
Toshiaki Adachi, Santa Clara, CA (US);
Yoshihumi Tahara, Santa Clara, CA (US);
Ramachandran Krishnaswamy, Santa Clara, CA (US);
Harsanjeet Singh, Santa Clara, CA (US);
Ankan Pramanick, Santa Clara, CA (US);
Mark Elston, Santa Clara, CA (US);
Leon Chen, Santa Clara, CA (US);
Toshiaki Adachi, Santa Clara, CA (US);
Yoshihumi Tahara, Santa Clara, CA (US);
Advantest Corporation, Tokyo, Nerima-Ku, JP;
Abstract
Test program development for a semiconductor test system, such as automated test equipment (ATE), using object-oriented constructs is described. The invention provides a method for describing test system resources, test system configuration, module configuration, test sequence, test plan, test condition, test pattern, and timing information in general-purpose object-oriented constructs, e.g., C++ objects and classes. In particular, the modularity of program development is suitable for developing test programs for an open architecture semiconductor test system.