The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Oct. 28, 2008
Applicants:

Takeo Okabe, Ibaraki, JP;

Shuichi Irumata, Ibaraki, JP;

Yasuhiro Yamakoshi, Ibaraki, JP;

Hirohito Miyashita, Ibaraki, JP;

Ryo Suzuki, Ibaraki, JP;

Inventors:

Takeo Okabe, Ibaraki, JP;

Shuichi Irumata, Ibaraki, JP;

Yasuhiro Yamakoshi, Ibaraki, JP;

Hirohito Miyashita, Ibaraki, JP;

Ryo Suzuki, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A hafnium alloy target containing either or both of Zr and Ti in a gross amount of 100 wtppm-10 wt % in Hf, wherein the average crystal grain size is 1-100 μm, the impurities of Fe, Cr and Ni are respectively 1 wtppm or less, and the habit plane ratio of the plane {002} and three planes {103}, {014} and {015} lying within 35° from {002} is 55% or greater, and the variation in the total sum of the intensity ratios of these four planes depending on locations is 20% or less. As a result, obtained is a hafnium alloy target having favorable deposition property and deposition speed, which generates few particles, and which is suitable for forming a high dielectric gate insulation film such as HfO or HfON film, and the manufacturing method thereof.


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