The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2012
Filed:
Oct. 03, 2008
Sameer H. Chakravarthy, Noida, IN;
Ratan Deep H. Singh, Chennai, IN;
Thomas Webster Bartenstein, Owego, NY (US);
Joseph Michael Swenton, Owego, NY (US);
Shaleen Bhabu, New Delhi, IN;
Sameer H. Chakravarthy, Noida, IN;
Ratan Deep H. Singh, Chennai, IN;
Thomas Webster Bartenstein, Owego, NY (US);
Joseph Michael Swenton, Owego, NY (US);
Shaleen Bhabu, New Delhi, IN;
Other;
Abstract
A method and system for test vector selection in statistical volume diagnosis using failed test data is disclosed. A computer-implemented method receives failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits. Each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus, and each of the plurality of failures is associated with a failed test vector. Using a first ranking scheme, each of the failures is given a rank and the corresponding failed test vector in each of the plurality of integrated circuits is annotated with the rank. The annotated failed test vectors are grouped using a grouping scheme, and each of the groups is given a group rank. A first group of failed test vectors is selected based on the group rank and diagnostics is run on the first group of failed test vectors.