Sameer H Chakravarthy

Title: Innovations of Sameer H Chakravarthy

Introduction: Sameer H Chakravarthy is a notable inventor based in Noida, India. He has made significant contributions to the field of integrated circuit testing. His work focuses on improving the efficiency and accuracy of diagnosing defects in integrated circuits.

Latest Patents: Sameer H Chakravarthy holds a patent for a method and system for selecting test vectors in statistical volume diagnosis using failed test data. This innovative method involves receiving failures that represent defects detected by an integrated circuit testing apparatus from multiple integrated circuits. Each integrated circuit is tested with a set of test vectors, and the failures are associated with the corresponding failed test vectors. The method employs a ranking scheme to assign ranks to the failures, which are then annotated and grouped for further diagnostics. This approach enhances the diagnostic process by selecting the most relevant test vectors based on their group ranks.

Career Highlights: Throughout his career, Sameer has demonstrated a commitment to advancing technology in the field of integrated circuits. His innovative solutions have contributed to more effective testing methodologies, ultimately leading to improved product reliability.

Collaborations: Sameer has worked alongside talented professionals such as Ratan Deep H Singh and Thomas Webster Bartenstein. Their collaborative efforts have fostered an environment of innovation and creativity in their projects.

Conclusion: Sameer H Chakravarthy's contributions to integrated circuit testing through his patented methods exemplify the impact of innovation in technology. His work continues to influence the field and improve diagnostic processes for integrated circuits.