Company Filing History:
1 out of 832,843 Years Active: 2012
Title: Ratan Deep H Singh: Innovator in Statistical Volume Diagnosis
Introduction
Ratan Deep H Singh is a notable inventor based in Chennai, India. He has made significant contributions to the field of integrated circuit testing, particularly in the area of statistical volume diagnosis. His innovative approach has the potential to enhance the efficiency of testing processes in the semiconductor industry.
Latest Patents
Ratan Deep H Singh holds a patent for a method and system for selecting test vectors in statistical volume diagnosis using failed test data. This computer-implemented method involves receiving failures that represent defects detected by an integrated circuit testing apparatus from multiple integrated circuits. Each integrated circuit is tested with a set of test vectors, and each failure is associated with a failed test vector. The method employs a ranking scheme to assign ranks to failures, annotating the corresponding failed test vectors. These annotated vectors are then grouped and ranked, allowing for the selection of a first group of failed test vectors for further diagnostics.
Career Highlights
Throughout his career, Ratan Deep H Singh has demonstrated a commitment to advancing technology in the field of integrated circuits. His work has not only contributed to the understanding of failure analysis but also to the development of more effective testing methodologies. His innovative solutions are paving the way for improvements in the reliability of integrated circuits.
Collaborations
Ratan Deep H Singh has collaborated with notable professionals in his field, including Sameer H Chakravarthy and Thomas Webster Bartenstein. These collaborations have fostered a productive exchange of ideas and have contributed to the advancement of their shared goals in integrated circuit testing.
Conclusion
Ratan Deep H Singh is a distinguished inventor whose work in statistical volume diagnosis is making a significant impact in the semiconductor industry. His innovative methods and collaborative efforts are setting new standards for integrated circuit testing.