The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Jun. 30, 2009
Yong-ju Kim, Gyeonggi-do, KR;
Sung-woo Han, Gyeonggi-do, KR;
Hee-woong Song, Gyeonggi-do, KR;
Ic-su OH, Gyeonggi-do, KR;
Hyung-soo Kim, Gyeonggi-do, KR;
Tae-jin Hwang, Gyeonggi-do, KR;
Hae-rang Choi, Gyeonggi-do, KR;
Ji-wang Lee, Gyeonggi-do, KR;
Jae-min Jang, Gyeonggi-do, KR;
Chang-kun Park, Gyeonggi-do, KR;
Yong-Ju Kim, Gyeonggi-do, KR;
Sung-Woo Han, Gyeonggi-do, KR;
Hee-Woong Song, Gyeonggi-do, KR;
Ic-Su Oh, Gyeonggi-do, KR;
Hyung-Soo Kim, Gyeonggi-do, KR;
Tae-Jin Hwang, Gyeonggi-do, KR;
Hae-Rang Choi, Gyeonggi-do, KR;
Ji-Wang Lee, Gyeonggi-do, KR;
Jae-Min Jang, Gyeonggi-do, KR;
Chang-Kun Park, Gyeonggi-do, KR;
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Abstract
A Delay Locked Loop (DLL) includes a replica delay unit configured to delay an output clock to generate a feedback clock; a phase detector configured to measure a phase difference between the feedback clock and an input clock; a quantization unit configured to quantize the phase difference measured by the phase detector; and a delay unit configured to delay the input clock based on a quantization result from the quantization unit to generate the output clock.