The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Jun. 16, 2006
Applicants:

Liang-gi Yao, Hsin-Chu, TW;

Ming-fang Wang, Taichung, TW;

Shih-chang Chen, Taoyuan, TW;

Mong-song Liang, Hsin-Chu, TW;

Inventors:

Liang-Gi Yao, Hsin-Chu, TW;

Ming-Fang Wang, Taichung, TW;

Shih-Chang Chen, Taoyuan, TW;

Mong-Song Liang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of reducing impurities in a high-k dielectric layer comprising the following steps. A substrate is provided. A high-k dielectric layer having impurities is formed over the substrate. The high-k dielectric layer being formed by an MOCVD or an ALCVD process. The high-k dielectric layer is annealed to reduce the impurities within the high-k dielectric layer.


Find Patent Forward Citations

Yao, Liang-Gi. (2011). Process to make high-k transistor dielectrics (U.S. Patent No. 8012824). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8012824

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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