The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Aug. 13, 2009
Applicants:

S. Jay Chey, Yorktown Heights, NY (US);

Timothy C. Krywanczyk, Essex Junction, VT (US);

Mohammed S. Shaikh, Essex Junction, VT (US);

Matthew T. Tiersch, Essex Junction, VT (US);

Cornelia Kang-i Tsang, Yorktown Heights, NY (US);

Inventors:

S. Jay Chey, Yorktown Heights, NY (US);

Timothy C. Krywanczyk, Essex Junction, VT (US);

Mohammed S. Shaikh, Essex Junction, VT (US);

Matthew T. Tiersch, Essex Junction, VT (US);

Cornelia Kang-I Tsang, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01K 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A silicon chicklet pedestal for use in a wafer-level test probe of a wafer is provided and includes a main body, first and second opposing faces, and an array of vias formed through the main body to extend between the first and second faces, through which pairs of leads, respectively associated with each via at the first and second faces, are electrically connectable to one another.


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