The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Nov. 01, 2007
Brian Foutz, Silver Spring, MD (US);
Patrick Gallagher, Apalachin, NY (US);
Vivek Chickermane, Ithaca, NY (US);
Carl Barnhart, Austin, TX (US);
Brian Foutz, Silver Spring, MD (US);
Patrick Gallagher, Apalachin, NY (US);
Vivek Chickermane, Ithaca, NY (US);
Carl Barnhart, Austin, TX (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A method for testing integrated circuits is provided. The method provides for incorporating compression and decompression logic into each sub-component of an integrated circuit, developing test modes that target different sub-components of the integrated circuit, selecting one of the test modes, applying a test pattern to one or more sub-components of the integrated circuit targeted by the one test mode, comparing a response from application of the test pattern to a known good response, and diagnosing the response to determine which part of the one or more sub-components targeted by the one test mode failed when the response does not match the known good response.