The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Jul. 24, 2007
Applicants:

Tadashi Shimazu, Kobe, JP;

Masahiko Inoue, Kobe, JP;

Toshihiko Nishimori, Takasago, JP;

Yuichi Kawano, Takasago, JP;

Inventors:

Tadashi Shimazu, Kobe, JP;

Masahiko Inoue, Kobe, JP;

Toshihiko Nishimori, Takasago, JP;

Yuichi Kawano, Takasago, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/425 (2006.01); H01L 21/31 (2006.01); H01L 21/469 (2006.01); H01L 21/00 (2006.01); H05H 1/24 (2006.01); H05H 1/02 (2006.01); H05H 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a plasma treatment method and a plasma treatment device capable of forming a silicon nitride film having high compressive stress. In the plasma treatment method for depositing the silicon nitride film on a process target substrate by use of plasma of raw material gas containing silicon and hydrogen and of nitrogen gas, ion energy for disconnecting nitrogen-hydrogen bonding representing a state of bonding between the hydrogen in the raw material gas and the nitrogen gas is applied to the process target substrate so as to reduce an amount of nitrogen-hydrogen bonding contained in the silicon nitride film.


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