The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Mar. 17, 2009
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, Szubin, PL;
Jerzy Tyszer, Poznan, PL;
Chen Wang, Tigard, OR (US);
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, Szubin, PL;
Jerzy Tyszer, Poznan, PL;
Chen Wang, Tigard, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.