The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7928571 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 19, 2011

Filed:

Sep. 06, 2007
Applicants:

Dureseti Chidambarrao, Weston, CT (US);

Ying LI, Newburgh, NY (US);

Rajeev Malik, Pleasantville, NY (US);

Shreesh Narasimha, Beacon, NY (US);

Inventors:

Dureseti Chidambarrao, Weston, CT (US);

Ying Li, Newburgh, NY (US);

Rajeev Malik, Pleasantville, NY (US);

Shreesh Narasimha, Beacon, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 29/40 (2006.01); H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 23/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a semiconductor device having dual silicon nitride liners and a reformed silicide layer and related methods for the manufacture of such a device. The reformed silicide layer has a thickness and resistance substantially similar to a silicide layer not exposed to the formation of the dual silicon nitride liners. A first aspect of the invention provides a method for use in the manufacture of a semiconductor device comprising the steps of applying a first silicon nitride liner to a silicide layer, removing a portion of the first silicon nitride liner, reforming a portion of the silicide layer removed during the removal step, and applying a second silicon nitride liner to the silicide layer.


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