The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Feb. 15, 2007
Applicants:

Seiji Ogata, Chigasaki, JP;

Ryota Fukui, Susono, JP;

Hidekazu Yokoo, Susono, JP;

Tsutomu Nishihashi, Susono, JP;

Inventors:

Seiji Ogata, Chigasaki, JP;

Ryota Fukui, Susono, JP;

Hidekazu Yokoo, Susono, JP;

Tsutomu Nishihashi, Susono, JP;

Assignee:

Ulvac Inc., Chigasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/317 (2006.01); H01J 37/256 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion implanter for manufacturing a single crystal film by extracting a hydrogen ion or a rare-gas ion from an ion source, selects a desired ion with a first sector electromagnet, scanning the ion with a scanner, collimates the ion with a second sector electromagnet, and implants it into a substrate; the ion source is configured to be located close to the entrance side focal point of the first sector electromagnet. In this case, when an aperture of an extraction section of the ion source is circular and entrance side focal points in a deflection surface and a surface perpendicular thereto in the first sector electromagnet are coincident, the ion beam after passing the first sector electromagnet becomes completely parallel in the two surfaces and the spot shape becomes a circle.


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