The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2010

Filed:

Aug. 12, 2008
Applicants:

Vishal Sarin, Cupertino, CA (US);

Dzung Nguyen, Fremont, CA (US);

Jonathan Pabustan, San Lorenzo, CA (US);

Jung Sheng Hoei, Fremont, CA (US);

Jason Guo, San Jose, CA (US);

William Saiki, Mountain View, CA (US);

Inventors:

Vishal Sarin, Cupertino, CA (US);

Dzung Nguyen, Fremont, CA (US);

Jonathan Pabustan, San Lorenzo, CA (US);

Jung Sheng Hoei, Fremont, CA (US);

Jason Guo, San Jose, CA (US);

William Saiki, Mountain View, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are disclosed, such as those involving a flash memory device that includes a memory block. The memory block includes a plurality of data lines extending substantially parallel to one another, and a plurality of memory cells. One such method includes erasing the memory cells; and performing erase verification on the memory cells. The erase verification includes determining one memory cell by one memory cell whether the individual memory cells coupled to one of the data lines have been erased. The method can also include performing a re-erase operation that selectively re-erases unerased memory cells based at least partly on the result of the erase verification.


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