The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2010

Filed:

Dec. 04, 2007
Applicants:

In-young Lee, Gyeonggi-do, KR;

Dong-ho Lee, Gyeonggi-do, KR;

Nam-seog Kim, Gyeonggi-do, KR;

Hyun-soo Chung, Gyeonggi-do, KR;

Ho-jin Lee, Seoul, KR;

Myeong-soo Park, Seoul, KR;

Inventors:

In-Young Lee, Gyeonggi-do, KR;

Dong-Ho Lee, Gyeonggi-do, KR;

Nam-Seog Kim, Gyeonggi-do, KR;

Hyun-Soo Chung, Gyeonggi-do, KR;

Ho-Jin Lee, Seoul, KR;

Myeong-Soo Park, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a wafer level chip scale package in which a redistribution process is applied at a wafer level, a manufacturing method thereof, and a semiconductor chip module including the wafer level chip scale package. The wafer level chip scale package includes a semiconductor chip having a bonding pad, a first insulating layer disposed on the semiconductor chip so as to expose the bonding pad, a redistribution line disposed on the exposed bonding pad and the first insulating layer, a sacrificial layer disposed below a redistribution pad of the redistribution line, a second insulating layer disposed on the redistribution line so as to expose the redistribution pad and including a crack inducement hole disposed beside the sacrificial layer, and an external connection terminal attached to the redistribution pad.


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