The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Jul. 24, 2007
Applicants:
Joke Van Aelst, Heusden-Zolder, BE;
Herbert Struyf, Kontich, BE;
Serge Vanhaelemeersch, Leuven, BE;
Inventors:
Assignee:
IMEC, Leuven, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for patterning high aspect ratio vias is provided. More specifically a dry etching method is provided for patterning deep vias or vias with high aspects ratios thereby eliminating the hard mask undercut. A method is provided to create (pattern) deep vias in a substrate for use in three dimensional stacked semiconductor devices and/or structures. More specifically, a method is provided for patterning deep vias with an aspect ratio up to 10 into a Si substrate with smooth via sidewalls and sufficient slope to enable metallization.