The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7807581 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 05, 2010

Filed:

Mar. 07, 2007
Applicants:

Susumu Tauchi, Shunan, JP;

Akitaka Makino, Hikari, JP;

Seiichi Watanabe, Hofu, JP;

Naoki Yasui, Kudamatsu, JP;

Inventors:

Susumu Tauchi, Shunan, JP;

Akitaka Makino, Hikari, JP;

Seiichi Watanabe, Hofu, JP;

Naoki Yasui, Kudamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a plasma processing apparatus or a plasma processing method that can etch a multilayer film structure for constituting a gate structure with high accuracy and high efficiency. A plasma processing method of, on processing a sample on a sample stagein a depressurized discharge room, etching a multilayer film (including a high-k and a metal gate) at 0.1 Pa or less and with the sample stagetemperature-regulated by using a pressure gaugeto be used for pressure regulation and connected to the processing room and a main pump for exhaustion


Find Patent Forward Citations

Tauchi, Susumu. (2010). Plasma processing apparatus and plasma processing method (U.S. Patent No. 7807581). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7807581

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