The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Oct. 15, 2007
Ishtiaq Ahsan, Wappingers Falls, NY (US);
Mark B. Ketchen, Hadley, MA (US);
Kevin Mcstay, Hopewell Junction, NY (US);
Oliver D. Patterson, Poughkeepsie, NY (US);
Ishtiaq Ahsan, Wappingers Falls, NY (US);
Mark B. Ketchen, Hadley, MA (US);
Kevin McStay, Hopewell Junction, NY (US);
Oliver D. Patterson, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A test structure for resistive open detection using voltage contrast (VC) inspection and method for using such structure are disclosed. The test structure may include a comparator within the IC chip for comparing a resistance value of a resistive element under test to a reference resistance and outputting a result of the comparing that indicates whether the resistive open exists in the resistive element under test, wherein the result is detectable by the voltage contrast inspection.