The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Dec. 01, 2006
Applicants:

Harry Sewell, Ridgefield, CT (US);

Diane Mccafferty, Sandy Hook, CT (US);

Louis John Markoya, Sandy Hook, CT (US);

Inventors:

Harry Sewell, Ridgefield, CT (US);

Diane McCafferty, Sandy Hook, CT (US);

Louis John Markoya, Sandy Hook, CT (US);

Assignee:

ASML Holding B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/54 (2006.01); G03B 27/42 (2006.01); G03B 27/72 (2006.01); G03B 27/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lithographic apparatus is presented. The lithographic apparatus includes a beam splitter configured to split a radiation beam into a plurality of radiation beams; a substrate stage configured to support a substrate; a beam combiner adapted to redirect and combine at least a portion of the plurality of radiation beams to form an interference pattern on the substrate; and a control unit in communication with the substrate stage and a radiation source configured to output the beam of radiation, the control unit configured to synchronize a motion of the substrate stage with a repetition rate at which the beam of radiation is output by the radiation source.


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