The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2010

Filed:

Oct. 24, 2007
Applicants:

Wai-fan Yau, Mountain View, CA (US);

David Cheung, Foster City, CA (US);

Shin-puu Jeng, Cupertino, CA (US);

Kuowei Liu, Santa Clara, CA (US);

Yung-cheng Yu, San Jose, CA (US);

Inventors:

Wai-Fan Yau, Mountain View, CA (US);

David Cheung, Foster City, CA (US);

Shin-Puu Jeng, Cupertino, CA (US);

Kuowei Liu, Santa Clara, CA (US);

Yung-Cheng Yu, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 5/12 (2006.01); H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for depositing a low dielectric constant film by reaction of an organo silane compound and an oxidizing gas. The oxidized organo silane film has excellent barrier properties for use as a liner or cap layer adjacent other dielectric layers. The oxidized organo silane film can also be used as an etch stop or an intermetal dielectric layer for fabricating dual damascene structures. The oxidized organo silane films also provide excellent adhesion between different dielectric layers. A preferred oxidized organo silane film is produced by reaction of methyl silane, CHSiH, and NO.


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