The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Jul. 19, 2007
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Dariusz Czysz, 60-965 Poznan, PL;
Jerzy Tyszer, 61-249 Poznan, PL;
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Dariusz Czysz, 60-965 Poznan, PL;
Jerzy Tyszer, 61-249 Poznan, PL;
Other;
Abstract
Disclosed below are representative embodiments of methods, apparatus, and systems used to generate test patterns for testing integrated circuits. Embodiments of the disclosed technology can be used to provide a low power test scheme and can be integrated with a variety of compression hardware architectures (e.g., an embedded deterministic test ('EDT') environment). Certain embodiments of the disclosed technology can reduce the switching rates, and thus the power dissipation, in scan chains with no hardware modification. Other embodiments use specialized decompression hardware and compression techniques to achieve low power testing.