The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7563723 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 21, 2009

Filed:

Aug. 03, 2006
Applicants:

Mirzafer K. Abatchev, Boise, ID (US);

David K. Hwang, Boise, ID (US);

Robert G. Veltrop, Eagle, ID (US);

Inventors:

Mirzafer K. Abatchev, Boise, ID (US);

David K. Hwang, Boise, ID (US);

Robert G. Veltrop, Eagle, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods of etching substrates with small critical dimensions and altering the critical dimensions are disclosed. In one embodiment, a sulfur oxide based plasma is used to etch an amorphous carbon hard mask layer. The features of a pattern can be shrunk using a plasma etch to reduce the resist elements on the surface of the masking structure. Features in the pattern can also be enlarged by depositing polymer on the resist elements or by sloping an underlying layer. In one preferred embodiment, features of the pattern are shrunk before being enlarged in order to reduce line edge roughness.


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Abatchev, Mirzafer. (2009). Critical dimension control for integrated circuits (U.S. Patent No. 7563723). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7563723

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