The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2009

Filed:

Jan. 10, 2005
Applicants:

Kwang-myung Lee, Suwon, KR;

Ki-young Yun, Suwon, KR;

Seung-ki Chae, Suwon, KR;

No-hyun Huh, Suwon, KR;

Wan-goo Hwang, Suwon, KR;

Jung-hyun Hwang, Suwon, KR;

Shinji Yanagisawa, Towada, JP;

Kengo Tsutsumi, Susono, JP;

Seiichi Takahashi, Ishioka, JP;

Inventors:

Kwang-Myung Lee, Suwon, KR;

Ki-Young Yun, Suwon, KR;

Seung-Ki Chae, Suwon, KR;

No-Hyun Huh, Suwon, KR;

Wan-Goo Hwang, Suwon, KR;

Jung-Hyun Hwang, Suwon, KR;

Shinji Yanagisawa, Towada, JP;

Kengo Tsutsumi, Susono, JP;

Seiichi Takahashi, Ishioka, JP;

Assignees:

Samsung Electronics Co., Ltd., Kyungki-Do, KR;

ULVAC, Inc., Kanagawa-Ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

In this etching method, since an etching gas is introduced before introduction of free radicals into a processing chamber, the etching gas has been adsorbed on the surface of substrates when the free radicals are introduced. Accordingly, the free radicals react with the etching gas adsorbed on the surface of the substrates, and the reaction proceeds uniformly on the surface of the substrate. As a result, nonuniform etching does not occur on the surface of the substrate. Moreover, since the reaction between the etching gas and the free radicals occurs on the surface of the substrate, an intermediate product produced according to the reaction between the etching gas and the free radicals reacts with an etching object promptly. Therefore, the intermediate product is not exhausted from the processing chamberexcessively, and hence the etching efficiency is high. As a result, according to this etching method, not only the in-plane distribution of the etching amount becomes more uniform, but also the etching rate is increased more than in the conventional etching method.


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