The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7452778 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 18, 2008

Filed:

Apr. 12, 2005
Applicants:

Hung-wei Chen, Hsinchu, TW;

Yee-chia Yeo, Singapore, SG;

Di-hong Lee, Austin, TX (US);

Fu-liang Yang, Hsin-Chu, TW;

Chenming HU, Alamo, CA (US);

Inventors:

Hung-Wei Chen, Hsinchu, TW;

Yee-Chia Yeo, Singapore, SG;

Di-Hong Lee, Austin, TX (US);

Fu-Liang Yang, Hsin-Chu, TW;

Chenming Hu, Alamo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

Nano-wires, preferably of less than 20 nm diameter, can be formed with minimized risk of narrowing and breaking that results from silicon atom migration during an annealing process step. This is accomplished by masking portion of the active layer where silicon atomer would otherwise agglomerate with a material such as silicon dioxide, silicon nitride, or other dielectric that eliminates or substantially reduces the silicon atom migration. Nano-wires, nanotubes, nano-rods, and other features can be formed and can optionally be incorporated into devices, such as by use as a channel region in a transistor device.


Find Patent Forward Citations

Chen, Hung-Wei. (2008). Semiconductor nano-wire devices and methods of fabrication (U.S. Patent No. 7452778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7452778

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