The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2008

Filed:

Sep. 02, 2004
Applicants:

Hidetomo Uemukai, Kumamoto-ken, JP;

Akira Ishihara, Tosu, JP;

Inventors:

Hidetomo Uemukai, Kumamoto-ken, JP;

Akira Ishihara, Tosu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 1/00 (2006.01); B08B 3/02 (2006.01); A46B 13/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a processing system for applying a cleaning processing to a substrate such as a semiconductor wafer which includes a cleaning processing section including a plurality of process units each serving to apply a predetermined treatment to a wafer and a loading/unloading sectionThe cleaning processing section includes four scrub cleaning units consisting of two scrub cleaning units arranged side by side and two additional cleaning units stacked on the two scrub cleaning units arranged side by side, respectively, so as to form upper and lower stages of the scrub cleaning units, a wafer inversion unit for turning the wafer upside down, a wafer transit unit having the wafer disposed thereon temporarily for performing the transfer of the wafer to and from the transfer section, and a main wafer transfer mechanism.


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