The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7432468 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 07, 2008

Filed:

Mar. 30, 2007
Applicants:

Shinsuke Oka, Kanagawa, JP;

Takahiro Horiguchi, Kanagawa, JP;

Kazuaki Nishimura, Kanagawa, JP;

Masayuki Kitamura, Kanagawa, JP;

Tadahiro Ohmi, Miyagi, JP;

Masaki Hirayama, Miyagi, JP;

Inventors:

Shinsuke Oka, Kanagawa, JP;

Takahiro Horiguchi, Kanagawa, JP;

Kazuaki Nishimura, Kanagawa, JP;

Masayuki Kitamura, Kanagawa, JP;

Tadahiro Ohmi, Miyagi, JP;

Masaki Hirayama, Miyagi, JP;

Assignees:

Tokyo Electron Limited, Tokyo, JP;

Tohoku University, Sendai-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microwave plasma processing apparatusallows microwaves, passed through a plurality of slots, to be transmitted through a plurality of dielectric partssupported by beams, raises a gas to plasma with the transmitted microwaves and processes a substrate G with the plasma. The beamsare made to project out toward the substrate so as to ensure that the plasma electron density Ne around the ends of the beamsis equal to or greater than a cutoff plasma electron density Nc. The projecting beamsinhibits interference attributable to surface waves generated with the electrical field energy of microwaves transmitted through adjacent dielectric partsand interference attributable to electrons and ions propagated through the plasma generated under a given dielectric partto reach the plasma generated under an adjacent dielectric part as the plasma generated under the individual dielectric partsis diffused.


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