The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Dec. 14, 2005
Philippe Schoenborn, San Mateo, CA (US);
Ramit Bhandari, Fremont, CA (US);
Tony Lo, San Jose, CA (US);
Anh-ha Tran, San Jose, CA (US);
Philippe Schoenborn, San Mateo, CA (US);
Ramit Bhandari, Fremont, CA (US);
Tony Lo, San Jose, CA (US);
Anh-Ha Tran, San Jose, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining background test data using a test routine to measure the leakage current for a set of test devices as a function of a parameter associated with device speed for the device under test. From the test data, a leakage threshold function is defined that correlates leakage current with the parameter associated with device speed. The test routine and the leakage threshold function are then input into an automated testing apparatus configured to execute the test on production or other devices. Devices are tested to determine leakage current over a range of parameter values associated with device speed. The devices are then screened using the leakage threshold function to determine the status of the device.