Ramit Bhandari

Title: Ramit Bhandari: Innovator in Automated Testing Technology

Introduction

Ramit Bhandari is a notable inventor based in Fremont, California. He has made significant contributions to the field of automated testing technology, particularly in identifying leakage-inducing defects in electronic devices. His innovative approach has the potential to enhance the reliability and efficiency of testing processes in the industry.

Latest Patents

Ramit Bhandari holds a patent for a method of using automated test equipment to screen for leakage-inducing defects after calibration to intrinsic leakage. The invention focuses on identifying test devices with excessive leakage current. It includes computer program products that facilitate this process. The method involves obtaining background test data through a test routine that measures leakage current based on a parameter associated with device speed. A leakage threshold function is defined from the test data, correlating leakage current with the device speed parameter. This function is then utilized in an automated testing apparatus to evaluate production devices, ensuring they meet the necessary standards.

Career Highlights

Ramit Bhandari is currently employed at LSI Corporation, where he applies his expertise in automated testing. His work has contributed to advancements in the field, making testing processes more efficient and reliable. His innovative methods are essential for maintaining high-quality standards in electronic device production.

Collaborations

Ramit has collaborated with notable colleagues, including Philippe Schoenborn and Tony Lo. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Ramit Bhandari's contributions to automated testing technology exemplify the impact of innovation in the electronics industry. His patent and work at LSI Corporation highlight his commitment to improving testing processes and ensuring device reliability.