Tony Lo

Title: The Innovative Contributions of Tony Lo

Introduction

Tony Lo is a notable inventor based in San Jose, California. He has made significant contributions to the field of automated testing equipment. His work focuses on improving the efficiency and accuracy of identifying leakage-inducing defects in electronic devices.

Latest Patents

Tony Lo holds a patent for a method of using automated test equipment to screen for leakage-inducing defects after calibration to intrinsic leakage. This invention is directed towards identifying test devices that exhibit excessive leakage current. The method involves obtaining background test data through a test routine that measures leakage current based on a parameter associated with device speed. From this data, a leakage threshold function is defined, which correlates leakage current with the device speed parameter. The automated testing apparatus then executes tests on production devices to determine their leakage current across various parameter values. This innovative approach enhances the screening process for electronic devices.

Career Highlights

Tony Lo has had a successful career at LSI Corporation, where he has applied his expertise in automated testing. His work has contributed to advancements in the reliability of electronic devices. He is recognized for his innovative methods that streamline testing processes and improve product quality.

Collaborations

Tony has collaborated with talented individuals such as Philippe Schoenborn and Ramit Bhandari. These collaborations have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Tony Lo's contributions to the field of automated testing equipment demonstrate his commitment to innovation and excellence. His patented method for screening leakage-inducing defects is a testament to his expertise and dedication to improving electronic device reliability.