The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7379785 B1

PDF
Full Text
Expired
Date of Patent:
May. 27, 2008

Filed:

Nov. 18, 2003
Applicants:

Makio Higashi, Kumamoto, JP;

Akira Miyata, Kumamoto, JP;

Inventors:

Makio Higashi, Kumamoto, JP;

Akira Miyata, Kumamoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a coating and developing apparatus that forms a resist film on substrates such as semiconductor wafers, and develops substrates exposed by an aligner, times after the aligner unloads substrates until heating units (PEB) start heating the substrates are kept uniform. Exposed wafers are prevented from being left stagnant in an interface portion disposed between a region in which resist is coated and developed and the aligner. In the region in which resist is coated and developed, a first transferring means that successively executes transportation cycles to transfer substrates from upstream side modules to downstream side modules in a flow of processes of substrates. N heating units (PEB) are disposed (n is for example 5). Exposed wafers loaded into the heating units (PEB) are unloaded by the first transferring means after (n−1) cycles including the transferring cycle of the first transferring means have elapsed.

Published as:
WO2004049408A1; AU2003280854A1; KR20050083939A; US2005287821A1; US7379785B2; KR20090109137A; KR100935291B1; KR100974141B1;

Find Patent Forward Citations

Higashi, Makio. (2008). Substrate processing system, coating/developing apparatus, and substrate processing apparatus (U.S. Patent No. 7379785). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7379785

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…