The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Dec. 12, 2003
Applicants:
Igor Keller, Sunnyvale, CA (US);
Kenneth Tseng, Cupertino, CA (US);
Nishath Verghese, Sunnyvale, CA (US);
Inventors:
Igor Keller, Sunnyvale, CA (US);
Kenneth Tseng, Cupertino, CA (US);
Nishath Verghese, Sunnyvale, CA (US);
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of delay change determination in an integrated circuit design including a stage with a victim net and one or more aggressor nets capacitively coupled thereto, the method comprising: determining a nominal (noiseless) victim net signal transition; determining a noisy victim net signal transition; and determining a delay change based upon nominal and noisy victim signal transition arrival times at a victim net receiver output.