The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Aug. 14, 2003
Applicants:
Yuri Erokhin, Newburyport, MA (US);
Kevin J. Dempsey, Somerville, MA (US);
Inventors:
Yuri Erokhin, Newburyport, MA (US);
Kevin J. Dempsey, Somerville, MA (US);
Assignee:
Ibis Technology Corporation, Danvers, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/322 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides methods for forming SOI wafers having internal gettering layers for sequestering metallic impurities. More particularly, in one embodiment of the invention, a plurality of sites for sequestering metallic impurities are formed in a silicon substrate by implanting a selected dose of oxygen ions therein. In one embodiment, an epitaxial layer of crystalline silicon is formed over the substrate, and a buried continuous oxide layer is generated in the epitaxial layer, for example, by employing a SIMOX process.