The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
May. 20, 2005
Daisuke Shindo, Miyagi, JP;
Yasukazu Murakami, Miyaki, JP;
Tetsuo Oikawa, Tokyo, JP;
Masao Inoue, Tokyo, JP;
Daisuke Shindo, Miyagi, JP;
Yasukazu Murakami, Miyaki, JP;
Tetsuo Oikawa, Tokyo, JP;
Masao Inoue, Tokyo, JP;
Tohoku University, Miyagi, JP;
JEOL Ltd., Tokyo, JP;
Abstract
There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microscope includes a biprism for producing interference between an electron beam transmitted through the specimen and an electron beam passing through a vacuum. The specimen is held to a holder. The microprobe is made of a magnetic material and has a needle-like tip. The microscope further includes a moving mechanism capable of moving the microprobe toward and away from the specimen.